Speaker
Description
The partial charge collection (PCC) layer is a transition interface between the back-end SiO2 (or SiO2 + ZrO2 + In) death layer and the high-purity Silicon bulk in a CCD. Due to the increased likelihood of re-absorption of electron-hole pairs in this region, the charge collection efficiency is typically below that in the bulk. This layer has a large impact on the efficiency loss of the optical spectrum, particularly in the blue region, significantly influencing the sensitivity and precision of back-illuminated CCD sensors. This study presents a preliminary measurement of the PCC layer using a 677 eV X-ray source and a 200 um back-illuminated thinned skipper-CCD. Additionally, I will discuss a method based on the PCC layer to assess the quantum efficiency of visible light without reliance on a calibrated light source or photodiode.
Keywords for your contribution subject matter (this will assist SOC in accurately characterizing your contribution)
Skipper-CCD, quantum efficiency
| contribution subject matter | CCD sensors |
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