12–14 Mar 2024
SLAC
America/Los_Angeles timezone

Image Persistence Flagging for SPHEREx

13 Mar 2024, 14:00
25m
48/1-112C/D - Redwood C/D (SLAC)

48/1-112C/D - Redwood C/D

SLAC

2575 Sand Hill Rd Bldg. 048 Menlo Park, CA 94025
60
Oral presentation (20 minute) Sensor and Systematics Characterization Systematics and Sensor Characterization

Speaker

Candice Fazar (Rochester Institute of Technology)

Description

Image persistence in HAWAII-2RG HgCdTe detectors has been observed by multiple parties. Also known as latent signal, this effect occurs when sensor images following an illumination show a decayed form of the illuminated image even though the source has been removed and the detector has been reset. Using data from an engineering grade detector delivered for SPHEREx testing illuminated with a wide range of fluxes, we demonstrate an interpretation and a working model from which the decaying signal can be estimated, providing the ability to flag pixels subject to excess persistence current beyond a user-defined threshold. Applying this model on a pixel-by-pixel basis may provide the framework for subtracting the offending persistent signal, thus mitigating the effect.

Keywords for your contribution subject matter (this will assist SOC in accurately characterizing your contribution)

persistence current, latent imaging, flagging, HAWAII-2RG, HgCdTe

contribution subject matter CMOS sensors

Primary author

Candice Fazar (Rochester Institute of Technology)

Co-authors

Phil Korngut (California Institute of Technology) Charles D. Dowell (Jet Propulsion Laboratory, California Institute of Technology) Chi Nguyen (California Institute of Technology) Brendan Crill (Jet Propulsion Laboratory, California Institute of Technology) Howard Hui (California Institute of Technology)

Presentation materials