Speaker
Steven Zeltmann
(Cornell)
Description
Four-dimensional scanning transmission electron microscopy, where the full forward scattering distribution of the electron beam is recorded by a 2D pixelated detector at each position in a scan, provides a wealth (a deluge?) of information about the sample. Detectors with high dynamic range enable quantitative analysis of the diffraction data, and their high speed (10-100k fps) allows us to defeat drift. In this talk I’ll discuss the factors that make a good diffraction detector, demonstrate how they’ve been leveraged for precise nanoscale measurement of strain, orientation, polarization, and fields, and discuss the strategies for managing and analyzing the large volumes of data they produce.
Author
Steven Zeltmann
(Cornell)
